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1

Integrating focused ion beam–scanning electron microscope with confocal Raman microscope into a single instrument

Jiruše, Jaroslav, Haničinec, Martin, Havelka, Miloslav, Hollricher, Olaf, Ibach, Wolfram, Spizig, Peter

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2014

Language:

english

File:

PDF, 4.31 MB

english, 2014

2

New High-Resolution Low-Voltage and High Performance Analytical FIB/SEM System

Jiruše, Jaroslav, Havelka, Miloslav, Haničinec, Martin, Polster, Jan, Hrnčíř, Tomáš

Journal:

Microscopy and Microanalysis

Year:

2014

Language:

english

File:

PDF, 1.37 MB

english, 2014

3

New Ultra-High Resolution SEM for Imaging by Low Energy Electrons

Jiruse, J., Havelka, M., Polster, J., Lopour, F.

Journal:

Microscopy and Microanalysis

Year:

2013

File:

PDF, 1.28 MB

2013

4

A New SEM Column Combining Ultra-High Resolution and Flexible Scanning

Sytaf, Petr, Jiruse, Jaroslav, Zavodny, Adam

Journal:

Microscopy and Microanalysis

Year:

2017

Language:

english

File:

PDF, 274 KB

english, 2017

5

Design of an Ultra-High Resolution SEM for Enhanced Analysis

Jiruse, Jaroslav, Havelka, Miloslav, Polster, Jan

Journal:

Microscopy and Microanalysis

Year:

2016

File:

PDF, 4.17 MB

2016

6

Design of an Ultra-High Resolution SEM for Enhanced Analysis

Jiruse, Jaroslav, Havelka, Miloslav, Polster, Jan

Journal:

Microscopy and Microanalysis

Year:

2016

Language:

english

File:

PDF, 4.17 MB

english, 2016

7

Spot intensity processing in LEED images

R Roučka, J Jiruše, T Šikola

Journal:

Year:

2002

Language:

english

File:

PDF, 104 KB

english, 2002

8

Application of simple kinematic predictions for the structural search in LEED

J. Jiruše, T. Šikola

Journal:

Year:

1999

Language:

english

File:

PDF, 179 KB

english, 1999

9

Stereological unfolding of the trivariate size-shape-orientation distribution of spheroidal particles with application

Viktor Benes˛, Marek Jirusˇe, Margarita Sla´mova´

Journal:

Acta Materialia

Year:

1997

Language:

english

File:

PDF, 1.05 MB

english, 1997

10

In situ measurements of surface homogeneity of optical parameters of weakly absorbing thin films

J. Spousta, M. Urbánek, R. Chmelík, J. Jiruše, J. Zlámal, K. Navrátil, A. Nebojsa, T. Šikola

Journal:

Surface and Interface Analysis

Year:

2002

Language:

english

File:

PDF, 198 KB

english, 2002

11

Effect of NCAM-transfection on growth and invasion of a human cancer cell line

KLAUS EDVARDSEN, ELISABETH BOCK, STANA JIRUS, THOMAS LETH FRANDSEN, CLAUS HOLST-HANSEN, CLAUS MOSER, MOGENS SPANG-THOMSEN, NINA PEDERSEN, FRANK S. WALSH, LARS L. VINDELØV, NILS BRÜNNER

Journal:

Year:

1997

Language:

english

File:

PDF, 2.64 MB

english, 1997

12

Structure and formation of surface alloys by adsorption of Li on Al(1 1 0)

A. Mikkelsen, J.H. Petersen, S.V. Hoffmann, J. Jiruse, D.L. Adams

Journal:

Surface Science

Year:

2001

Language:

english

File:

PDF, 567 KB

english, 2001

13

The surface structures formed by Na adsorption on Al(1 1 0)

A. Mikkelsen, J.H. Petersen, J. Jiruse, S.V. Hoffmann, D.L. Adams

Journal:

Surface Science

Year:

2002

Language:

english

File:

PDF, 1.87 MB

english, 2002

14

FIB-SIMS quantification using TOF-SIMS with Ar and Xe plasma sources

Stevie, F. A., Sedlacek, L., Babor, P., Jiruse, J., Principe, E., Klosova, K.

Journal:

Surface and Interface Analysis

Year:

2014

Language:

english

File:

PDF, 217 KB

english, 2014

15

Structure and dynamics of the Al(110) surface

Mikkelsen, A., Jiruse, J., Adams, D. L.

Journal:

Physical Review B

Year:

1999

Language:

english

File:

PDF, 53 KB

english, 1999

16

Surface reconstruction and relaxation of

Mikkelsen, A., Hoffmann, S. V., Jiruse, J., Adams, D. L.

Journal:

Physical Review B

Year:

2000

Language:

english

File:

PDF, 178 KB

english, 2000

17

[IEEE 2012 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) - Xi'an, China (2012.08.29-2012.09.1)] 2012 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) - The step towards an ultimate multifunctional tool for nanotechnology

Zadrazil, Martin, Jiruse, Jaroslav, Lencova, Bohumila, Dluhos, Jiri, Hrncir, Tomas, Rudolf, Miroslav, Sedlacek, Libor, Samoril, Tomas

Year:

2012

Language:

english

File:

PDF, 1.41 MB

english, 2012

18

[IEEE 2012 14th International Conference on Transparent Optical Networks (ICTON) - Coventry, United Kingdom (2012.07.2-2012.07.5)] 2012 14th International Conference on Transparent Optical Networks (ICTON) - Single-material submicron microstructured fibres for broadband applications in exact slope compensation or zero-dispersion propagation

Lucki, Michal, Jiruse, David, Kraus, Stanislav

Year:

2012

Language:

english

File:

PDF, 256 KB

english, 2012

19

Combined plasma FIB-SEM

Jiruse, J., Hrncir, T., Lopour, F., Zadrazil, M., Delobe, A., Salord, O.

Journal:

Microscopy and Microanalysis

Year:

2012

Language:

english

File:

PDF, 1.13 MB

english, 2012

20

Combined SEM-FIB-SPM-TOF-EDX-EBSD as a Multifunctional Tool

Jiruse, J., Sedlacek, L., Rudolf, M., Friedli, V., Oestlund, F., Whitby, J.

Journal:

Microscopy and Microanalysis

Year:

2012

Language:

english

File:

PDF, 400 KB

english, 2012

21

High Spatial Resolution Time-of-Flight Secondary Ion Mass Spectrometry for the Masses: A Novel Orthogonal ToF FIB-SIMS Instrument with In Situ AFM

Whitby, James A., Östlund, Fredrik, Horvath, Peter, Gabureac, Mihai, Riesterer, Jessica L., Utke, Ivo, Hohl, Markus, Sedláček, Libor, Jiruše, Jaroslav, Friedli, Vinzenz, Bechelany, Mikhael, Michler, J

Journal:

Advances in Materials Science and Engineering

Year:

2012

Language:

english

File:

PDF, 1.52 MB

english, 2012

22

Insulator Analysis Using Combined FIB-SEM instrument with TOF-SIMS

Sedláček, Libor, Kološová, Jolana, Jiruše, Jaroslav, Stevie, Fred A.

Journal:

Microscopy and Microanalysis

Year:

2014

Language:

english

File:

PDF, 1.02 MB

english, 2014

23

Novel Cathodoluminescence Detector with Extremely Large Field of View

Kološová, Jolana, Jiruše, Jaroslav

Journal:

Microscopy and Microanalysis

Year:

2014

Language:

english

File:

PDF, 1.32 MB

english, 2014

24

On the Calculation of SEM and FIB Beam Profiles

Kološová, Jolana, Hrnčíř, Tomáš, Jiruše, Jaroslav, Rudolf, Miroslav, Zlámal, Jakub

Journal:

Microscopy and Microanalysis

Year:

2015

Language:

english

File:

PDF, 1.02 MB

english, 2015

25

FIB-SEM Instrument with Integrated Raman Spectroscopy for Correlative Microscopy

Jiruse, Jaroslav, Hanicinec, Martin, Havelka, Miloslav, Hollricher, Olaf, Ibach, Wolfram, Spizig, Peter

Journal:

Microscopy and Microanalysis

Year:

2014

Language:

english

File:

PDF, 1.40 MB

english, 2014

26

Low Energy BSE Imaging with a New Scintillation Detector

Kolosova, J., Jiruse, J., Fiala, J., Beranek, J.

Journal:

Microscopy and Microanalysis

Year:

2015

Language:

english

File:

PDF, 815 KB

english, 2015

27

A Detection System with Controlled Surface Sensitivity for a New UHR SEM

Sytaf, Petr, Jiruse, Jaroslav, Paral, Jan

Journal:

Microscopy and Microanalysis

Year:

2017

Language:

english

File:

PDF, 266 KB

english, 2017

28

Xe Plasma FIB-SEM with Improved Resolution of Both Ion and Electron Columns

Jiruse, J., Havelka, M., Polster, J., Hrncif, T.

Journal:

Microscopy and Microanalysis

Year:

2015

Language:

english

File:

PDF, 245 KB

english, 2015

29

Correlative SEM and Raman imaging of hot spots on SERS substrate

Vana, R., Kocman, M., Jiruse, J.

Journal:

Microscopy and Microanalysis

Year:

2015

Language:

english

File:

PDF, 167 KB

english, 2015

30

European Microscopy Congress 2016: Proceedings || Surface-sensitive investigation of semiconductor devices with a signal-selective SEM detection system

Jiruše, Jaroslav

Year:

2016

File:

PDF, 4.98 MB

2016

31

European Microscopy Congress 2016: Proceedings || Ultra-High Resolution SEM for Materials Analysis

Jiruše, Jaroslav

Year:

2016

File:

PDF, 414 KB

2016

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